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Park NX-Wafer is a revolutionary AFM solution designed for bare wafer manufacturing that fully automates the defect review process and increases production throughput by the astounding 1,000%. Discover unique application capabilities of the Wafer Series with automatic defect review (ADR), low noise atomic force profiler for accurate, high throughput CMP profile measurements and sub-angstrom surface roughness measured with extreme accuracy and minimized tip-to-tip variation. Learn more: https://p
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