Light carrying photon momentum can push and pull microparticles through momentum exchange. This momentum exchange process generates optical forces, which either attracts (conventional optical tweezers ...
(PhysOrg.com) -- Researchers from the NIST Center for Nanoscale Science and Technology and the NIST Material Measurement Laboratory have demonstrated that a simpler technique for calibrating lateral ...
(Nanowerk Spotlight) The realization of a three-dimensional tomic force microscopy (3D AFM) portends exciting research directions across nanoscience and nanotechnology. Demonstrations to date have ...
Looking at the sides of molecules: Lateral force microscopy reveals previously unseen hydrogen atoms
Artist's rendition of a LFM tip coming close to the side of a molecule, where it is sensitive to the terminal H-atoms. (Image: A. J. Weymouth) Hydrogen atoms situated at the edges of molecules affect ...
Atomic force microscopy (AFM) is a technique used to characterize surfaces at extremely high resolution. A sharp probe is brought into close proximity with the sample to be analyzed. Probe and sample ...
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